SPARC Webinar: “Autonomous Raman microscopy system for the analysis of trace residues on surfaces by non-expert users” with Eric Miller and Romain Blanchard

Eric Miller of Tufts University and Romain Blanchard of Pendar Technologies present, “Autonomous Raman microscopy system for the analysis of trace residues on surfaces by non-expert users”

For users without YouTube access: Autonomous Raman microscopy system for the analysis of trace residues on surfaces by non-expert users

To view the webinar slides: Autonomous Raman microscopy system for the analysis of trace residues on surfaces by non-expert users webinar slides

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