SPARC Webinar: June 24


On the fusion of X-ray data types for enhanced materials characterization 
with Prof. Eric Miller, Professor and Chair of Electrical and Computer Engineering, Tufts University and Dr. Dan Strellis, Sr. Director R&D, Rapiscan Systems

The slides and video presentation of the June 24th webinar is now available online!

ALERT is launching a free online summer series titled, SPARC (Seminars to Promote ALERT Research and Collaboration). SPARC aims to give you a preview of the ground-breaking technologies to be demonstrated at the ALERT Technology Showcase in November.

The first webinar of the series will be held on June 24th from 11:30am – 12:00pm EST. More information on the presentation can be found below:

Title: On the fusion of X-ray data types for enhanced materials characterization  

Presenters: Eric Miller, Professor and Chair of Electrical and Computer Engineering, Tufts University and Dan Strellis, Sr. Director R&D, Rapiscan Systems

Abstract: Enhancing the capabilities of X-ray methods for materials characterization requires that we exploit interactions of X-rays and matter beyond the commonly considered process of attenuation.  Here we discuss recent work in X-ray based imaging schemes based on the collection and processing of both scattered and diffracted photons in addition to the typical transmitted beams. Our first focus is on the fusion of scatter and attenuation data to improve the recovery of electron density and effective atomic number.  We then move on to the formulation and solution of a new imaging problem for mapping the Bragg cross section as a function of space and momentum transfer.  In both cases, we provide a formulation of the physical processes in terms of Radon-type integrals over families of curves and illustrate how the resulting mathematical analysis leads to practical algorithms.  DHS-relevant examples are provided for sensing geometries motivated by the Rapiscan RTT6040. 

Speaker Bios: 

Professor Eric Miller received a B.S. in 1990, an M.S. in 1992, and a Ph.D. in 1994, all in electrical engineering and computer science at MIT. He is a professor in and the chair of the Department of Electrical and Computer Engineering at Tufts School of Engineering and holds adjunct appointments in the Departments of Computer Science and Biomedical Engineering. His research interests include physics-based tomographic image formation and object characterization, inverse problems in general and inverse scattering in particular, regularization, statistical signal and imaging processing, and computational physical modeling.

Dr. Dan Strellis is the Senior Director of R&D at Rapican Systems. He leads the program team to deliver R&D projects that provide innovative technologies to Rapiscan Systems Detection product lines and Government customers. Dr. Strellis received his PhD in Nuclear Engineering from the University of California, Berkeley.

If you are interested in attending or have any questions, please reach out to Tiffany Lam at [email protected] for more information.

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